发明名称 WATER AND METHOD FOR KEEPING SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To provide water and a method for keeping silicon wafer by which the deterioration of the quality of a silicon wafer, such as of the oxide-film withstand voltage, etc., can be prevented by preventing the surface of the wafer from being contaminated with Cu and, in addition, such a metal as Al, etc., which has not been prevented by the conventional keeping water. SOLUTION: At the time of keeping the silicon wafer in pure water, hydrogen peroxide and a citric acid are added to the pure water.
申请公布号 JP2002043390(A) 申请公布日期 2002.02.08
申请号 JP20000224465 申请日期 2000.07.25
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 ABE TATSUO;KANAZAWA KENICHI;MIZUNO MICHIHIKO
分类号 H01L21/677;H01L21/304;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/677
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