发明名称 |
FLASH MEMORY HAVING SIDEWALL FLOATING GATE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A flash memory having a sidewall floating gate and a fabricating method thereof are provided to lower the height of the flash memory by forming a floating gate on a sidewall of a control gate. CONSTITUTION: A field oxide layer is formed on a semiconductor substrate(1). A control gate oxide layer(3c) is partially formed on the semiconductor substrate(1). A control gate(4) is formed on the control gate oxide layer(3c). An insulating layer(5) is formed on the control gate(4). A floating gate oxide layer(3d) is formed on the semiconductor substrate(1). A floating gate(6) is formed on the floating gate oxide layer(3d). A sidewall(7) is formed on a side portion of the floating gate(6). An LDD region(12) is formed within the semiconductor substrate(1). A source/drain region(13) is formed between the sidewall(7) and the field oxide layer.
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申请公布号 |
KR100325619(B1) |
申请公布日期 |
2002.02.08 |
申请号 |
KR20000042452 |
申请日期 |
2000.07.24 |
申请人 |
ANAM SEMICONDUCTOR CO., LTD. |
发明人 |
KIM, HONG SEUB |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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