发明名称 |
COPPER-BASED LEAD MATERIAL FOR SEMICONDUCTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a copper-based lead material for a semiconductor and its manufacturing method difficult to produce warp even when flatness is high, etching processing and dimple processing are performed. SOLUTION: The manufacturing method of the lead material includes a first process for correcting the copper-based lead material for the semiconductor and a copper alloy plate-like material comprising the copper alloy plate-like body in which residual stress in the thickness direction of a cross section parallel to the extension direction of the copper alloy plate-like body is less than 10 N/mm2 and -30 N/mm2 or more in high elongation of 0.10% or more and a second process for correcting a correction material by using a multi-label at low tension of 29 N/mm2 or less.
|
申请公布号 |
JP2002043498(A) |
申请公布日期 |
2002.02.08 |
申请号 |
JP20000221404 |
申请日期 |
2000.07.21 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
MITANI YOJI |
分类号 |
B21D1/05;H01L23/50;(IPC1-7):H01L23/50 |
主分类号 |
B21D1/05 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|