发明名称 |
MOS FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a MOS field effect transistor with a reduced resistance between a source and a drain. SOLUTION: A gate insulating film 210 and a gate electrode 220 are formed successively on a semiconductor substrate 200. Then a deep source/drain region 230 is formed in the upper region of the semiconductor substrate outside the side wall of the gate electrode. Then an extending source/drain region 240 thinner than the deep source/drain region and extending toward a channel region under the gate electrode is formed in the upper region of the semiconductor substrate. Then a 1st silicide layer 261 with a 1st thickness is formed in the upper surface of the deep source/drain region, and a 2nd silicide layer 262 extending from the 1st silicide layer but with a 2nd thickness thinner than the 1st thickness of the 1st silicide layer is formed in a part of the surface part of the upper part of the extending source/drain region.
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申请公布号 |
JP2002043328(A) |
申请公布日期 |
2002.02.08 |
申请号 |
JP20010123229 |
申请日期 |
2001.04.20 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
YANG JEONG-HWAN;KIM YOUNG-WUG |
分类号 |
H01L21/28;H01L21/336;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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