发明名称 Focus measurement in projection exposure apparatus
摘要 Disclosed is a method of detecting focus information about an image projecting optical system, in which mark projection is made through the optical system and based on illumination lights having different chief ray incidence directions, the mark projection being carried out so that mark images formed by the illumination lights, respectively, are superposed one upon another approximately upon an imaging plane, and focus information about the optical system is detected on the basis of information related to a deviation between the mark images superposed.
申请公布号 US2002015158(A1) 申请公布日期 2002.02.07
申请号 US20010811420 申请日期 2001.03.20
申请人 SHIODE YOSHIHIRO;TSUKAMOTO IZUMI;MOROHOSHI HIROSHI;KAWANOBE YOSHIO 发明人 SHIODE YOSHIHIRO;TSUKAMOTO IZUMI;MOROHOSHI HIROSHI;KAWANOBE YOSHIO
分类号 G01B11/00;G03F7/20;G03F7/207;G03F9/00;G03F9/02;H01L21/027;(IPC1-7):G01B11/14 主分类号 G01B11/00
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