发明名称 FIELD EFFECT TRANSISTOR STRUCTURE WITH PARTIALLY ISOLATED SOURCE/DRAIN JUNCTIONS AND METHODS OF MAKING SAME
摘要 A microelectronic structure includes at least one source/drain terminal of a first conductivity type that is partially isolated from a region of semiconductor material of a second conductivity type. In a further aspect of the invention, a process for forming a microelectronic structure, such as a MOSFET, having at least one source/drain terminal of a first conductivity type that is partially isolated from a region of semiconductor material of a second conductivity type includes forming a recess having a surface, forming a dielectric material over a portion of the surface of the recess, and back-filling the recess to form a source/drain terminal.
申请公布号 WO0150535(A3) 申请公布日期 2002.02.07
申请号 WO2000US42279 申请日期 2000.11.27
申请人 INTEL CORPORATION;MURTHY, ANAND, S.;CHAU, ROBERT, S.;MORROW, PATRICK;MCFADDEN, ROBERT, S. 发明人 MURTHY, ANAND, S.;CHAU, ROBERT, S.;MORROW, PATRICK;MCFADDEN, ROBERT, S.
分类号 H01L21/336;H01L29/06;(IPC1-7):H01L29/06;H01L21/306 主分类号 H01L21/336
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