| 摘要 |
<p>An electrical test probe tip (8) comprising a conductive flexible coil (10, 30, 52) having a first end and a second end. The first end is for flexibly coupling with a device to be probed. The second end is attached to a connector (12, 12', 13). The connector (12, 12', 13) may be an integral connection with a probing head (13) or may be a connecting pin (12). Multiple test probe and ground reference points. The present invention is also directed to a method for using the flexible spring tip (8).</p> |
