发明名称 Multilayer thin film and its fabrication process as well as electron device
摘要 The invention has for its objects to provide a multilayer thin film comprising a ferroelectric thin film preferentially (001) oriented on an Si substrate, its fabrication process, and an electron device. To attain these object, the invention provides a multilayer thin film formed on a substrate by epitaxial growth, which comprises a buffer layer comprising an oxide and a ferroelectric thin film, with a metal thin film and an oxide thin film formed in this order between the buffer layer and the ferroelectric thin film, its fabrication process, and an electron device.
申请公布号 US2002015852(A1) 申请公布日期 2002.02.07
申请号 US20010842805 申请日期 2001.08.21
申请人 TDK CORPORATION 发明人 NOGUCHI TAKAO;YANO YOSHIHIKO;SAITOU HISATOSHI;ABE HIDENORI
分类号 C30B23/02;C30B25/02;(IPC1-7):B32B9/04;C30B25/00 主分类号 C30B23/02
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