发明名称 Source reagent compositions for CVD formation of high dielectric constant and ferroelectric metal oxide thin films and method of using same
摘要 Chemical vapor deposition (CVD) precursor compositions for forming metal oxide high dielectric constant (kappa) thin films. The precursor composition in one embodiment comprises a metal precursor having a general formula M(beta-diketonate)2(OR)2, wherein M is Hf, Zr or Ti, and R is t-butyl. The precursor composition may also comprise a solvent medium selected from the group consisting of ethers, glymes, tetraglymes, amines, polyamines, alcohols, glycols, aliphatic hydrocarbon solvents, aromatic hydrocarbon solvents, cyclic ethers, and compatible combinations of two or more of the foregoing.
申请公布号 US2002015790(A1) 申请公布日期 2002.02.07
申请号 US20010907282 申请日期 2001.07.17
申请人 ADVANCED TECHNOLOGY MATERIALS INC. 发明人 BAUM THOMAS H.;ROEDER JEFFREY F.;XU CHONGYING;HENDRIX BRYAN C.
分类号 C07F7/00;C23C16/40;(IPC1-7):C23C16/00 主分类号 C07F7/00
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