发明名称 METHOD OF FABRICATING A METAL PLUG OF A SEMICONDUCTOR DEVICE USING A NOVEL TIN BARRIER LAYER
摘要 A method of fabricating a metal plug comprises steps of providing a substrate and forming a dielectric layer on the substrate with an opening to expose part of the substrate. The method further comprises steps of forming a metal layer on the dielectric layer, forming a first barrier layer by chemical vapor deposition (CVD) to provide a better step coverage, and forming a second barrier layer by physical vapor deposition (PVD) to make the barrier layer harder and less water absorptive. A metal layer is then formed on the second barrier layer and is removed by etching back to form the metal plug.
申请公布号 US2002016063(A1) 申请公布日期 2002.02.07
申请号 US19990322054 申请日期 1999.05.27
申请人 CHEN MING-SHING;HSU BILL 发明人 CHEN MING-SHING;HSU BILL
分类号 H01L21/768;(IPC1-7):H01L21/44;H01L21/476 主分类号 H01L21/768
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