CONTACT PROBE AND MANUFACTURING METHOD THEREOF

摘要

PROBLEM TO BE SOLVED: To precisely and easily recognize a pin tip in a contact probe and a manufacturing method thereof. SOLUTION: This contact prove 10 comprises a plurality of pattern wirings 12 formed on the surface of a film 11, each tip of the patter wiring being arranged in a state protruded from the tip part of the film to form a contact pin 12a. The contact pin has a contact area C to make contact with a measuring matter IC at the tip, and the surfaces of this contact area and at least an area adjacent to the contact area on the base end side have different light reflectances.