发明名称 |
Method and apparatus for image restitution in scanning microscopy and scanning microscope |
摘要 |
Method for phase correction of position and detection signals for use in scanning microscopy has the following steps: (a) generation of a position signal from the position of a beam deflector (7) and production of a detection signal (21) from the light (17) originating from the object (15); (b) transfer of the position signal (25) and detection signal (21) to a processing unit (23); (c) determination of correction values and transfer of correction values to the processing unit for comparison of time differences between position and detection signals. Independent claims are included for the following: (1) a device for phase correction of position and detection signals from a scanning microscope; (2) a scanning microscope with phase correction. |
申请公布号 |
EP1178344(A1) |
申请公布日期 |
2002.02.06 |
申请号 |
EP20010117175 |
申请日期 |
2001.07.14 |
申请人 |
LEICA MICROSYSTEMS HEIDELBERG GMBH |
发明人 |
ENGELHARDT, JOHANN, DR. |
分类号 |
G01B21/00;G02B21/00;G02B26/10 |
主分类号 |
G01B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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