发明名称 PROBE DEVICE AND PROBE UNIT
摘要 PROBLEM TO BE SOLVED: To provide a probe device capable of preventing the breakage of a measuring instrument by static electricity charged on a circuit board. SOLUTION: This probe device comprises a pair of conductive members 11, a short circuit member 12 for electrically connecting the conductive members 11 to each other by making contact with the respective conductive members 11, and a housing 13 for supporting the conductive members 11 and the short circuit member 12. The respective conductive members 11 are arranged so as to cross the short circuit 12 and make contact with the short circuit member 12. The conductive members 11 are mounted on the housing 13 through an elastic member 15, so that the conductive members 11 are relatively displaceable to the housing 13 and also separable from the short circuit member 12 after electrostatic elimination.
申请公布号 JP2002040050(A) 申请公布日期 2002.02.06
申请号 JP20000224336 申请日期 2000.07.25
申请人 OHT INC 发明人 KANEISHI YUKIO;ISHIOKA SEIGO
分类号 G01R1/073;G01R27/02;(IPC1-7):G01R1/073 主分类号 G01R1/073
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