| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that conventionally a detection limit or the like, in which a detecting area of a curved surface is extremely narrowed if a work has a flat surface and the curved surface, because the conventional surface defect inspecting apparatuses have a constant emitting angle for illumination light and a constant imaging angle for camera. SOLUTION: The surface defect inspecting apparatus comprises a work- conveying means 1 for intermittently conveying a work K, a flat surface detecting sensor 2 for imaging a flat surface F, while moving with respect to the work W stopped at a prescribed position, and a curved surface detecting sensor 3 for imaging the curved surface R, while moving with respect to the work W stopped at the prescribed position in a continuous direction of a bent section of the surface R. Thus, a conveying treating function of the work W is enhanced, and then the surface defect detection can be conducted accurately, irrespective of the conveying speed of the work and a curvature of the surface R for both the surface F and the surface R.
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