发明名称 FLUORESCENT LIGHT EMISSION FLAW DETECTOR
摘要 PROBLEM TO BE SOLVED: To overcome the problem of a prior art fluorescent light emission flaw detector such that the flaw detector becomes expensive because a unit for imaging the surface of a work under test with high resolution is required. SOLUTION: The fluorescent light emission flaw detector comprises a section 6 for coating a work 1 with fluorescent liquid, a cleaning section 7 for removing the fluorescent liquid except the part of a flaw in the work, an ultraviolet light 2 for irradiating the work with UV rays to cause emission of fluorescent light from the fluorescent light remaining on the work after cleaning, a photosensor 10 for converting an optical signal of fluorescent emission into an electric signal, and a section 12 for making a decision whether the work is acceptable or not, based on an output signal from the photosensor. Inspection time can be shortened and the flaw detector can be made inexpensive as a whole.
申请公布号 JP2002039954(A) 申请公布日期 2002.02.06
申请号 JP20000225523 申请日期 2000.07.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 KAMEYAMA SHUNPEI;KIMURA TOMONORI;WADAKA SHUZO
分类号 G01N21/91;G01N27/84;(IPC1-7):G01N21/91 主分类号 G01N21/91
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