| 摘要 |
A defective pixel detecting method and an image-pickup apparatus having a plurality of solid-state image-pickup devices (3, 4, 5) each receiving respective one of spectral lights obtained by separating light incident to the image-pickup apparatus, generating, for each spectral light, a value relating to an inspected defective pixel on an associated solid-state image-pickup device located at a corresponding same image-pickup point among the plurality of solid-state image-pickup devices based on a signal level (Rn, Gn, Bn) produced from the inspected pixel and signal levels (Rn-2, Rn-1, Rn+1, Rn+2) produced from a plurality of pixels of the associated solid-state image-pickup device in the vicinity of the inspected pixel, and determining the solid-state image-pickup device (3, 4, 5) that generated a defective pixel based on the values obtained with respect to the plurality of solid-state image-pickup devices. <IMAGE> |
