| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing apparatus, capable of reducing the cost of the logical comparator for logical comparison of an LCD driver IC having a large number of driver outputs. SOLUTION: In the semiconductor testing device for logically comparing the plurality of outputs of a DUT with each expected value at the same timing and testing them, a solving means is provided with a latch means to latch and output the plurality of output of the DUT, a multiplexeer means for receiving the latched outputs and selectively output them, and a logical comparison means to logically compare the selected output with the expected value.
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