| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing device capable of reducing the OFF capacity in a switch for separation from a device to be tested and performing a more precise test. SOLUTION: This testing device comprises a first supply part capable of supplying a first current to an electronic device, a second supply part capable of supplying a second current smaller than the first current to the electronic device, and a first feedback circuit for feeding back the voltage applied to the electronic device to the first supply part. This device further comprises a first switch for switching the electric connection or non-connection of the electronic device to the first feedback circuit, and the second supply part is provided through the first switch to the electronic device, whereby the number of switches for separating the testing device from the electronic device is reduced to reduce the OFF capacity of the switch.
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