| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for generating approximate a waveform capable of generating an approximate waveform with high approximate precision to a given analog waveform, and a semiconductor testing device capable of performing a precise quality judgment. SOLUTION: The value of the analog waveform is gained in a plurality of timings, the approximate values of the values of the analog waveform in the respective timings are calculated, and an approximate waveform is generated on the basis of the timings and the approximate value in each timing. Each of the timings is corrected, whereby the approximate waveform with high approximate precision is generated. Each of the timings is set to a timing where the square error of the value of the analog waveform and the approximate value in each timing is minimized, whereby an approximate waveform with a small error can be generated. In this semiconductor testing device, the above approximate waveform with high approximate precision is used as a test signal, whereby the quality judgment can be precisely performed.
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