发明名称 SEMICONDUCTOR TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To attain reductions in power consumption and heating value, an improvement in frequency characteristic and a reduction in noise superposition. SOLUTION: A control circuit 25 supplies a control signal CS1 for designating the set voltage of a DUT 9 to a control circuit 5 as a control signal CS8. A control circuit 25 controls switching power sources 21 and 22 and polarity control circuits 23 and 24 on the basis of the control signal CS1 and the detection signal DS2 fed back from the DUT 9 so that the voltage drops of control elements 6 and 7 are values sufficient to operate the control elements 6, 7 by control signals CS4-CS7. The control circuit 5 controls the control elements 6 and 7 according to the control signal CS8. The control elements 6 and 7 generate the voltages to be outputted to the DUT 9 from the output voltages generated in the switching power sources 21 and 22 and polarity-controlled in polarity judgment circuits 23 and 24, and apply them to the DUT 9 of a DUT board 8.
申请公布号 JP2002040090(A) 申请公布日期 2002.02.06
申请号 JP20000225862 申请日期 2000.07.26
申请人 ANDO ELECTRIC CO LTD 发明人 TAKEUCHI NOBUNARI
分类号 G01R31/26;G01R31/28;G01R31/317;(IPC1-7):G01R31/26 主分类号 G01R31/26
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