发明名称 INSPECTION DEVICE FOR ELECTRONIC PART
摘要 PROBLEM TO BE SOLVED: To quickly judge the acceptability of characteristic of an electronic part. SOLUTION: This device comprises first and second measurement parts 5 and 6 to substantially simultaneously measure the characteristics of two electronic parts 1 retained by a U-shaped first stopper 1. The sorting of an acceptable product and a non-acceptable product is performed by use of a second stopper 8.
申请公布号 JP2002040100(A) 申请公布日期 2002.02.06
申请号 JP20000225628 申请日期 2000.07.26
申请人 SANKEN ELECTRIC CO LTD 发明人 NAGANO RIKIYA
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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