发明名称 An ion beam apparatus
摘要 <p>An ion beam apparatus comprises a source of ions (1), an evacuatable chamber (11), first and second electrodes (3,5) disposed within the chamber for forming an ion beam from ions from the ion source, the first electrode being electrically insulated from the second electrode. First and second supports for (17,19) supporting said first and second electrodes, respectively, are provided. The apparatus is arranged to allow said electrodes to be moved independently of one another relative to said chamber from outside said chamber. &lt;IMAGE&gt;</p>
申请公布号 EP1178517(A1) 申请公布日期 2002.02.06
申请号 EP20010203085 申请日期 1996.07.19
申请人 APPLIED MATERIALS, INC. 发明人 BURGIN, DAVID RICHARD;POVALL, SIMON;LOOME, DAVID
分类号 H01J27/02;H01J27/08;H01J37/08;H01J37/15;(IPC1-7):H01J37/15 主分类号 H01J27/02
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