发明名称 Methods of processing semiconductor wafers, methods of supporting a plurality of semiconductor wafers, methods of processing electronic device workpieces and methods of orienting electronic device workpieces
摘要 An aspect of the present invention provides a method of processing electronic device workpieces, individual electronic device workpieces having a front surface and a back surface, the method includes providing an electronic device workpiece carrier including a plurality of workpiece receivers; positioning individual electronic device workpieces within the workpiece receivers, the positioning orienting the front surface of one electronic device workpiece to face the front surface of a first immediately adjacent electronic device workpiece and orienting the back surface of the one electronic device workpiece to face the back surface of a second immediately adjacent electronic device workpiece; and positioning the electronic device workpiece carrier within an electronic device workpiece processor and processing the electronic device workpieces with the electronic device workpieces so oriented.
申请公布号 US6344091(B2) 申请公布日期 2002.02.05
申请号 US20010785828 申请日期 2001.02.16
申请人 MICRON TECHNOLOGY, INC. 发明人 MENDIOLA JEFF
分类号 H01L21/673;(IPC1-7):B44C1/22;C03C15/00;C03C25/68;C23G1/00 主分类号 H01L21/673
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