发明名称 |
Methods of processing semiconductor wafers, methods of supporting a plurality of semiconductor wafers, methods of processing electronic device workpieces and methods of orienting electronic device workpieces |
摘要 |
An aspect of the present invention provides a method of processing electronic device workpieces, individual electronic device workpieces having a front surface and a back surface, the method includes providing an electronic device workpiece carrier including a plurality of workpiece receivers; positioning individual electronic device workpieces within the workpiece receivers, the positioning orienting the front surface of one electronic device workpiece to face the front surface of a first immediately adjacent electronic device workpiece and orienting the back surface of the one electronic device workpiece to face the back surface of a second immediately adjacent electronic device workpiece; and positioning the electronic device workpiece carrier within an electronic device workpiece processor and processing the electronic device workpieces with the electronic device workpieces so oriented.
|
申请公布号 |
US6344091(B2) |
申请公布日期 |
2002.02.05 |
申请号 |
US20010785828 |
申请日期 |
2001.02.16 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
MENDIOLA JEFF |
分类号 |
H01L21/673;(IPC1-7):B44C1/22;C03C15/00;C03C25/68;C23G1/00 |
主分类号 |
H01L21/673 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|