发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: To provide a method wherein a deposition material is removed surely and effectively from a barrier film without any damages in a contact hole etching including the barrier film. CONSTITUTION: A method is provided for manufacturing a semiconductor device which includes the first insulation film and the barrier film on a conductive region and an opening in a first insulation film and the barrier film. The purpose is achieved by the method for manufacturing the semiconductor device comprising a step of forming the first opening reaching the first insulation film in the barrier film, a step of forming a second insulation film at least overlying the first insulation film of the first opening and a step of forming the second opening smaller than the first opening reaching the conductive region by opening the first and the second insulation films by one operation within the first opening.
申请公布号 KR20020009426(A) 申请公布日期 2002.02.01
申请号 KR20010043295 申请日期 2001.07.19
申请人 SHARP CORPORATION 发明人 ARII ISAKU;TOHDA TOSHIYUKI
分类号 H01L21/302;H01L21/28;H01L21/3065;H01L21/311;H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L21/302
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