发明名称 SEMICONDUCTOR DEVICE AND PRODUCTION METHOD THEREFOR
摘要 PURPOSE: To surely form a fine DRAM concerning a production method for a semiconductor device having a contact hole to be formed in the manner of self-matching. CONSTITUTION: A transfer gate(TG) housing grove is formed on a first layer insulating film 44 formed on a silicon substrate 10. Inside the groove, a TG 33 provided with a side wall 34 is formed. On the condition of selectively removing the first layer insulating film 44, the contact hole is formed at a part adjacent to the TG 33 in the self-matching manner and inside that contact hole, a contact plug 50 is formed. On the upper layer thereof, a bit line 60 or capacitor conducted with the contact plug 50 is formed.
申请公布号 KR20020009388(A) 申请公布日期 2002.02.01
申请号 KR20010015428 申请日期 2001.03.24
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SHINKAWATA HIROKI
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8238;H01L21/8242;H01L23/522;H01L27/092;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/28
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