发明名称 SELF-ALIGNED METAL SILICIDE
摘要 A structure of self-aligned metal silicide. A gate oxide layer is formed on a substrate. A gate with a sidewall and a top surface thereof is formed on the gate oxide layer. A first silicidation step is performed to form a first metal silicide layer on both the sidewall and the top surface. A spacer is formed to cover the first metal silicide layer on the sidewall of the gate. An ion implantation is performed to form a source/drain region in the substrate with the gate as a mask. A second silicidation step is formed to form a second metal silicide layer on the source/drain region.
申请公布号 US2002011631(A1) 申请公布日期 2002.01.31
申请号 US19990293419 申请日期 1999.04.16
申请人 HONG GARY 发明人 HONG GARY
分类号 H01L21/28;H01L21/336;H01L29/49;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/28
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