发明名称 Semiconductor device manufacturing method including forming step of SOI structure and semiconductor device having SOI structure
摘要 A semiconductor manufacturing method has the steps of preparing an SOI substrate having a supporting substrate, an insulating film formed above the supporting substrate, a semiconductor region formed above the insulating film, and an intermediate layer formed between the supporting substrate and the insulating film, forming a semiconductor element in the semiconductor region, and removing the intermediate layer to separate the supporting substrate and the semiconductor region in which the semiconductor element is formed.
申请公布号 US2002011670(A1) 申请公布日期 2002.01.31
申请号 US20010893454 申请日期 2001.06.29
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HIGASHI KAZUYUKI;TAKASE TAMAO;SHIBATA HIDEKI
分类号 H01L21/762;H01L21/84;H01L21/98;H01L23/48;H01L25/065;H01L27/12;(IPC1-7):H01L29/40;H01L23/52 主分类号 H01L21/762
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