发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a method for manufacturing the same are provided to reduce a dielectric constant and to improve a step coverage of an interlayer dielectric containing a coating insulating layer. CONSTITUTION: A coating insulating layer(26) is formed on a semiconductor substrate by coating a coating liquid containing, wherein the coating liquid is one selected from a group consisting of a silicon-contained inorganic compound and a silicon-contained organic compound. A protection layer(27) is formed on the coating insulating layer(26) by plasma treatment a first film formation gas to react. At this time, the first film formation gas is one selected from a group consisting of an alkoxy compound having Si-H bonds, a siloxane having Si-H bonds and any one oxygen-containing gas selected from a group consisting of O2, N2O, CO, CO2, and H2O.
申请公布号 KR20020008755(A) 申请公布日期 2002.01.31
申请号 KR20010042751 申请日期 2001.07.16
申请人 CANON SALES CO., INC.;SEMICONDUCTOR PROCESS LABORATORY CO., LTD. 发明人 AOKI JUNICHI;KOROMOKAWA TAKASHI;MAEDA KAZUO;OKU TAIZO;YAMAMOTO YOUICHI
分类号 H01L21/31;C23C16/40;C23C16/509;H01L21/312;H01L21/316;H01L21/768;(IPC1-7):H01L21/31 主分类号 H01L21/31
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