发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a method for manufacturing the same are provided to reduce a dielectric constant and to improve a step coverage of an interlayer dielectric containing a coating insulating layer. CONSTITUTION: A coating insulating layer(26) is formed on a semiconductor substrate by coating a coating liquid containing, wherein the coating liquid is one selected from a group consisting of a silicon-contained inorganic compound and a silicon-contained organic compound. A protection layer(27) is formed on the coating insulating layer(26) by plasma treatment a first film formation gas to react. At this time, the first film formation gas is one selected from a group consisting of an alkoxy compound having Si-H bonds, a siloxane having Si-H bonds and any one oxygen-containing gas selected from a group consisting of O2, N2O, CO, CO2, and H2O.
|
申请公布号 |
KR20020008755(A) |
申请公布日期 |
2002.01.31 |
申请号 |
KR20010042751 |
申请日期 |
2001.07.16 |
申请人 |
CANON SALES CO., INC.;SEMICONDUCTOR PROCESS LABORATORY CO., LTD. |
发明人 |
AOKI JUNICHI;KOROMOKAWA TAKASHI;MAEDA KAZUO;OKU TAIZO;YAMAMOTO YOUICHI |
分类号 |
H01L21/31;C23C16/40;C23C16/509;H01L21/312;H01L21/316;H01L21/768;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|