| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that moving a probe is necessary for every inspection in conventional circuit board-inspecting apparatuses, thereby requiring a time for the movement in addition to a measuring time at all times, and also a mechanism is needed for moving each of many probe heads in a method of loading the many probe heads to enhance an inspection efficiency, thereby costing a large sum. SOLUTION: There is provided a function of changing an interval to the other small probe head infinitely variably by mounting a plurality of small probe heads on one large probe head and driving one small probe head by a cam. The circuit board-inspecting apparatus has the plurality of probe heads mounted on one probe head and is provided with a function of bringing the probe in contact with both ends of a circuit by one probe head by driving the one probe head by the cam and changing the interval to the other probe head infinitely variably.
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