发明名称 BONDING OPTION CIRCUIT
摘要 PURPOSE: A bonding option circuit is provided to simultaneously check an operation of X8 package product using X16 package product. CONSTITUTION: A determination circuit(25) determines X8 or X16, and a bonding pad(23) is connected to the determination circuit(25). A resistor(24) is connected to a connection node(N1) between the bonding pad and the determination circuit. A lead frame(21) of a ground voltage is connected to the bonding pad(23) through a bonding wire(22). An NMOS transistor(26) has a drain terminal connected to the connection node(N1) and a source terminal connected to ground voltage(VSS). A test mode circuit(27) is connected to a gate of the NMOS transistor(26). At testing X8, a user sets the NMOS transistor to the ground(VCC) with operating X8 by a test mode.
申请公布号 KR20020008610(A) 申请公布日期 2002.01.31
申请号 KR20000042441 申请日期 2000.07.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, YEONG GI
分类号 H01L21/60;(IPC1-7):G01R31/26 主分类号 H01L21/60
代理机构 代理人
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