发明名称 EL DISPLAY DEVICE AND ITS INSPECTING METHOD
摘要 PROBLEM TO BE SOLVED: To reduce manufacturing cost by confirming the operation of a TFT substrate before forming the film of EL(electroluminescence) material in an active matrix type EL display device to enhance the rate of non-defective products of final products. SOLUTION: In this display device, whether the TFT for drive is operates normally or not is judged by providing a capacitance for inspection which is connected to the drain region of the TFT for drive of a pixel part and by confirming the charge and discharge of the capacitance for inspection. As a result, it is possible to eliminate defective products before the film formation of the EL material and, thus, manufacturing cost can be reduced.
申请公布号 JP2002032035(A) 申请公布日期 2002.01.31
申请号 JP20010140333 申请日期 2001.05.10
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KOYAMA JUN
分类号 H05B33/10;G09F9/00;G09F9/30;G09G3/20;G09G3/30;H01L27/32;H01L51/50;H05B33/14 主分类号 H05B33/10
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