| 摘要 |
PROBLEM TO BE SOLVED: To enable to specify existence of troubles, places, the number of them, or the like with a BIST test of only one time without adding complex circuit constitution. SOLUTION: Discrimination of a normal/defective condition is performed successively using a test circuit incorporated in a memory 10 based on address information supplied to the memory 10, consequently, fault discrimination information outputted from a comparing circuit 13 and address information outputted from an address counter circuit 11 are taken successively in a logic scan chain 15 and held. Thereby, the logic scan chain 15 provided previously for a logic test is utilized effectively for a memory test, and information about defective places and the number of defect of one or more can be obtained in the logic scan chain 15 with a BIST test of only one time without adding complex circuit constitution.
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