发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE MANUFACTURED BY THE METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an etching method for a compound semiconductor, by which an embedded re-grown interface having few crystal defects is realized. SOLUTION: Wet etching by the mixed liquid of hydrobromic acid and bromine and water within a range of hydrobromic-acid concentration of 0.50±0.25 mol/l and bromine concentration of 0.02±0.01 mol/l is used for removing the damaged layer of a mesa which is formed through dry etching.</p> |
申请公布号 |
JP2002033305(A) |
申请公布日期 |
2002.01.31 |
申请号 |
JP20000217212 |
申请日期 |
2000.07.13 |
申请人 |
HITACHI LTD |
发明人 |
SHINODA KAZUNORI;OYA AKIRA;SATO HIROSHI |
分类号 |
G02F1/017;G02F1/025;H01L21/302;H01L21/306;H01L21/3065;H01L31/10;H01S5/02;H01S5/227;H01S5/323;(IPC1-7):H01L21/306 |
主分类号 |
G02F1/017 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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