发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE MANUFACTURED BY THE METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an etching method for a compound semiconductor, by which an embedded re-grown interface having few crystal defects is realized. SOLUTION: Wet etching by the mixed liquid of hydrobromic acid and bromine and water within a range of hydrobromic-acid concentration of 0.50±0.25 mol/l and bromine concentration of 0.02±0.01 mol/l is used for removing the damaged layer of a mesa which is formed through dry etching.</p>
申请公布号 JP2002033305(A) 申请公布日期 2002.01.31
申请号 JP20000217212 申请日期 2000.07.13
申请人 HITACHI LTD 发明人 SHINODA KAZUNORI;OYA AKIRA;SATO HIROSHI
分类号 G02F1/017;G02F1/025;H01L21/302;H01L21/306;H01L21/3065;H01L31/10;H01S5/02;H01S5/227;H01S5/323;(IPC1-7):H01L21/306 主分类号 G02F1/017
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