发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To eliminate the influence of a wiring delay on the measurement of the access time of a macrocell. SOLUTION: A signal TD is fed to an input D of a macrocell 101 via a multiplexer 102, a clock TCLK is fed to the macrocell 101 via a multiplexer 103, a signal Q of the macrocell 101 is outputted via a multiplexer 104 to a pad 109, and the clock TCLK is also outputted from a pad 110 via the multiplexers 103, 105. The time T1 for outputting the signal Q from the pad 109 after application of the clock TCLK to a pad 108 and the time T2 (or outputting the clock TCLK from the pad 110 after application of the clock TCLK to the pad 108 are measured to compute T1-T2. This computation result substantially agrees with the access time of the macrocell 101 minus a wiring delay.
申请公布号 JP2002033455(A) 申请公布日期 2002.01.31
申请号 JP20000216851 申请日期 2000.07.18
申请人 OKI ELECTRIC IND CO LTD 发明人 MATSUI KATSUAKI
分类号 G01R31/28;G01R31/3185;G06F11/22;G11C29/00;G11C29/02;G11C29/12;G11C29/56;H01L21/822;H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址