发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide various gate electrode arrangements by using one mask, a shifter edge type phase shift mask for instance, and to efficiently develop, manufacture a prototype and manufacture and FET and an IC at a low cost. SOLUTION: A phase shifter 23 is formed on the entire exposure region of a transparent substrate 22, shifter edges 24 are arrayed with a fixed pitch p and the shifter edge type phase shift mask 21 is formed. By using the phase shift mask 21, openings are made with the fixed pitch on a photoresist and the openings are filled with a separate photoresist. Then, only required opening are exposed, by using a normal mask and a desired opening pattern is obtained.</p>
申请公布号 JP2002033333(A) 申请公布日期 2002.01.31
申请号 JP20000213749 申请日期 2000.07.14
申请人 MURATA MFG CO LTD 发明人 SASAKI HIDEHIKO
分类号 G03F1/34;G03F1/68;H01L21/027;H01L21/28;H01L21/338;H01L27/095;H01L29/812;(IPC1-7):H01L21/338;G03F1/08 主分类号 G03F1/34
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