发明名称 Sputtering apparatus
摘要 <p>In order to provide technology where film deposition speed and Sr/Ti composition ratio is constant even when forming dielectric films consecutively on a plurality of substrates using sputtering techniques, a sputtering apparatus of the present invention is provided with an opposing electrode located about the periphery of a mounting table at an inner bottom surface of a vacuum chamber. Further, a multiplicity of holes are formed at the surface of the opposing electrode so that the surface area of the opposing electrode is large. Sputtered dielectric material becomes affixed to the surface of the opposing electrode so that a dielectric film is formed at this surface. The charge density of charge distributed at the surface of the opposing electrode is therefore small compared with the related art even when positive charge is distributed. The potential of the opposing electrode surface can therefore be kept substantially at earth potential. Discharges within the vacuum chamber are therefore stable because the potential of the surface of the opposing electrode is kept substantially at earth potential. It is therefore difficult for the fluctuations in film thickness distribution and film deposition speed and instabilities in the discharges that occur in the related art to occur. &lt;IMAGE&gt;</p>
申请公布号 EP1176625(A2) 申请公布日期 2002.01.30
申请号 EP20010118054 申请日期 2001.07.25
申请人 ULVAC, INC. 发明人 TANI, NORIAKI;SAITO, KAZUHIKO;SUU, KOUKOU
分类号 H01L21/203;C23C14/34;C23C14/08;H01J37/34;H01L21/31;(IPC1-7):H01J37/34 主分类号 H01L21/203
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