IC TEST SOFTWARE SYSTEM FOR MAPPING LOGICAL FUNCTIONAL TEST DATA OF LOGIC INTEGRATED CIRCUITS TO PHYSICAL REPRESENTATION,申请号EP19990958909-传众专利搜索

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发明名称	IC TEST SOFTWARE SYSTEM FOR MAPPING LOGICAL FUNCTIONAL TEST DATA OF LOGIC INTEGRATED CIRCUITS TO PHYSICAL REPRESENTATION
摘要
申请公布号	EP1149385(A4)	申请公布日期	2002.01.30
申请号	EP19990958909	申请日期	1999.11.12
申请人	KNIGHTS TECHNOLOGY, INC;TEXAS INSTRUMENTS INCORPORATED	发明人	SMITH, SHAWN;BALACHANDRAN, HARI;PARKER, JASON;WATTS BUTLER, STEPHANIE
分类号	G01R31/317;G01R31/28;G01R31/3183;H01L21/66;(IPC1-7):G11C29/00;G01R31/318	主分类号	G01R31/317
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