发明名称 APPARATUS FOR MONITORING VARIATION OF INNER PRESSURE OF DIFFUSION FURNACE TUBE IN SEMICONDUCTOR EQUIPMENT
摘要 PURPOSE: An apparatus for monitoring a variation of an inner pressure of a diffusion furnace tube in semiconductor equipment is provided to prevent a difference of thickness of oxide layers by monitoring a variation of an inner pressure of a diffusion furnace tube. CONSTITUTION: A pressure sensor(10) is installed at a front end of an exhaust line valve. A sensor controller(12) senses a pressure measured by the pressure sensor(10) and the sensed pressure applies to MFC(Mass Flow Control unit)(14). The MFC(14) supplies gas a heater chamber and a load lock chamber and applies the sensed pressure to a gas control board(28) of a tube computer(16). The tube computer(16) includes a CPU board(22), a memory board(24), an interface board(26), a gas control board(28), a boat/loader control board(30), and a thermal control board(32). The tube computer(16) sets up an interlock, controls each board and an alarm sound. A MUX computer(18) controls each control device totally. A display portion(20) displays an internal pressure value of a tube according to a control operation of the MUX computer(18). An alarm portion(21) generates the alarm sound according to the control operation of the MUX computer(18).
申请公布号 KR20020006920(A) 申请公布日期 2002.01.26
申请号 KR20000040466 申请日期 2000.07.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KOO, HYEONG HYO;LEE, SEUNG JIN
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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