NONVOLATILE SEMICONDUCTOR MEMORY DEVICE HAVING TEST FUNCTION

摘要

PURPOSE: A nonvolatile semiconductor memory device having a test function is provided, which can minimize a test time and can test more flash memories within shorter time during a wafer test step. CONSTITUTION: The nonvolatile semiconductor memory device comprises an address counter(80) generating a plurality of address signals in response to a signal from the external and an address selection circuit(90) controlling paths of the address signals. A plurality of switches are connected between a memory array(10) and data input/output pins and are divided into a fixed number of switch groups. And a switch control circuit(100) generates switch control signals controlling the opening/closing of the switch groups in response to the external input signal. A part of the data input/output pins are used to correspond to the number of the switch groups.