发明名称 HEAT TREATMENT EQUIPMENT AND SUBSTRATE TREATMENT DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a heat treatment equipment which enables to prevent an incomplete heating and to transport a substrate smoothly even if a misregistration occurs. SOLUTION: The heating and cooling treatment apparatus 43 is provided with a hot plate 72 mounting a wafer W, a first supporting pin 77 movable up and down which absorbs by an absorbing opening 80 the wafer W received from the main transportation system 13 at a transporting position P1 and mounts the wafer W onto a heating position P2 on the hot plate 72, a cooling plate 91 which mounts the wafer W to cool, and position sensors 100, 101 which detect the position of the wafer W before transporting it.</p>
申请公布号 JP2002025904(A) 申请公布日期 2002.01.25
申请号 JP20010127670 申请日期 2001.04.25
申请人 TOKYO ELECTRON LTD 发明人 ASAKA KOICHI;INADA HIROICHI;IIDA NARIAKI;SEKIMOTO EIICHI
分类号 H05B3/00;H01L21/027;H01L21/68;H01L21/683;(IPC1-7):H01L21/027 主分类号 H05B3/00
代理机构 代理人
主权项
地址