| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that persons who can relieve a memory device are restricted to the manufacturer and the other manufacturer using the memory device, and when a fault is occurred while a memory product is used, the product cannot help being scrapped even if a place where defect is occurred is only a portion of the part. SOLUTION: Even if a defective memory cell is occurred at the time of using a memory device, a defective memory cell occurred in a non-volatile memory device being electrically erasable and writable can be relieved by switching to a redundancy memory cell, substantially, a life time can be extended and the device is extremely effective. |
