发明名称 |
METHOD OF CREATING DESIGN RULE, DESIGN RULE CREATING SYSTEM, AND RECORDING MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of creating design rules, which enables obtaing easy creation of an optimal design rule, without much time or labor. SOLUTION: This method comprises a process of conducting a compaction of design layout of a semiconductor IC device so as to satisfy specified design rules; a process of predicting the finish shape of a pattern on a wafer, based on the design layout subjected to the compaction process; a process of comparing the estimated finish shape with the design layout subjected to the compaction process; a process of judging whether an evaluation result obtained from the comparison process satisfies a predetermined criterion; a process of altering the design rule, when the evaluation result is judged as being not satisfying the criterion; and a process of defining the altered design rule as a new design rule for the compaction process.
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申请公布号 |
JP2002026126(A) |
申请公布日期 |
2002.01.25 |
申请号 |
JP20000199839 |
申请日期 |
2000.06.30 |
申请人 |
TOSHIBA CORP |
发明人 |
KOTANI TOSHIYA;TANAKA SATOSHI;INOUE SOICHI |
分类号 |
H01L21/00;G06F17/50;H01L21/82;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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