发明名称 OVERCURRENT PROTECTION CIRCUIT OF POWER SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an overcurrent protection circuit of power semiconductor element which controls, when a fault such as short-circuit is generated, a value of protection resistance for protecting a power semiconductor element, such as IGBT not to become extremely large value and thereby, to prevent the switching time of the power semiconductor element under the short-circuit conditions from becoming very long and also to prevent increase in losses at off condition. SOLUTION: The overcurrent protection circuit is provided at least with a driver control circuit 6, a fault detection circuit 7, a protection circuit, a charge injection circuit 31 and a power supply 9. The charge injection circuit 31 is composed of a one-shot circuit 32, a switch 33 and a resistor 34. The one-shot circuit 32 turns on the switch 33, only for the preset time interval, when a fault detection signal S3 is inputted from the fault detection circuit 7. Thereby, charges are injected from the power supply 9 to an input terminal of the IGBT (TR1), only for the preset time interval.
申请公布号 JP2002027657(A) 申请公布日期 2002.01.25
申请号 JP20000204561 申请日期 2000.07.06
申请人 FUJI ELECTRIC CO LTD 发明人 TAKIZAWA AKITAKE
分类号 H02H3/087;H02H3/093;H02H7/20;H02M1/00;H02M7/48 主分类号 H02H3/087
代理机构 代理人
主权项
地址