发明名称 SURFACE TREATING METHOD OF SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a surface treating method of a substrate having irregularities on the surface (e.g. a semiconductor substrate having protruding insulating parts and recessed electrode parts formed on the surface being used in the formation of a metal film pattern) in which only the protrusions can be reformed selectively in the fabrication of a semiconductor device. SOLUTION: Properties at the surface part of protrusions on a substrate (A) are varied selectively by touching the surface part of a planar or sheet-like article (B) only to the surface part of protrusions on the substrate (A) having irregularities on the surface.
申请公布号 JP2002026049(A) 申请公布日期 2002.01.25
申请号 JP20000206442 申请日期 2000.07.07
申请人 NITTO DENKO CORP;DENSO CORP 发明人 TOYODA HIDESHI;NAMIKAWA AKIRA;NORITAKE CHIKAGE;KONDO ICHIJI;MIYAJIMA TAKESHI
分类号 H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/60
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