发明名称 |
SURFACE TREATING METHOD OF SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a surface treating method of a substrate having irregularities on the surface (e.g. a semiconductor substrate having protruding insulating parts and recessed electrode parts formed on the surface being used in the formation of a metal film pattern) in which only the protrusions can be reformed selectively in the fabrication of a semiconductor device. SOLUTION: Properties at the surface part of protrusions on a substrate (A) are varied selectively by touching the surface part of a planar or sheet-like article (B) only to the surface part of protrusions on the substrate (A) having irregularities on the surface.
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申请公布号 |
JP2002026049(A) |
申请公布日期 |
2002.01.25 |
申请号 |
JP20000206442 |
申请日期 |
2000.07.07 |
申请人 |
NITTO DENKO CORP;DENSO CORP |
发明人 |
TOYODA HIDESHI;NAMIKAWA AKIRA;NORITAKE CHIKAGE;KONDO ICHIJI;MIYAJIMA TAKESHI |
分类号 |
H01L21/60;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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地址 |
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