发明名称 |
GCIB SIZE DIAGNOSTICS AND WORKPIECE PROCESSING |
摘要 |
Methods and apparatus for measuring the distribution of cluster ion sizes in a gas cluster ion beam (GCIB) (202) and for determining the mass distribution and mass flow of cluster ions in a GCIB processing system (200) without necessitating the rejection of a portion of the beam (202) through magnetic or electrostatic mass analysis. The invention uses time-of-flight measurement means (226) to estimate or monitor cluster ion size distribution either before or during processing of a workpiece (210). The measured information is displayed and incorporated in automated control of a GCIB processing system.
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申请公布号 |
WO0206556(A1) |
申请公布日期 |
2002.01.24 |
申请号 |
WO2001US41366 |
申请日期 |
2001.07.13 |
申请人 |
EPION CORPORATION |
发明人 |
MACK, MICHAEL, E.;TORTI, RICHARD, P. |
分类号 |
H01J49/40;C23C14/22;C23C14/52;C23C14/54;H01J37/304;H01J49/06;(IPC1-7):C23C14/00;C23F1/04;H01J37/244 |
主分类号 |
H01J49/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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