发明名称 Thin film, method for manufacturing thin film, and electronic component
摘要 A method for manufacturing a thin film is performed such that the internal stress is controlled while the preferred orientation property is maintained at a high value. An AlN piezoelectric thin film is formed on a substrate by a sputtering method using a mixed gas including Ar and nitrogen, wherein the mixed gas has a nitrogen flow rate ratio, that is, nitrogen flow rate relative to the sum of the Ar flow rate and the nitrogen flow rate, of about 10% to about 75%.
申请公布号 US2002008443(A1) 申请公布日期 2002.01.24
申请号 US20010874713 申请日期 2001.06.05
申请人 MURATA MANUFACTURING CO., LTD. 发明人 YAMADA HAJIME;TAKEUCHI MASAKI
分类号 H01L49/02;C23C14/06;C23C14/34;H01L41/09;H01L41/18;H01L41/24;H03H3/02;H03H9/17;(IPC1-7):C23C14/00;C23C14/32;H01P7/00;H02N2/00;H01L41/04;H01L41/08 主分类号 H01L49/02
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