发明名称 |
CONFIGURABLE INTEGRATED CIRCUIT AND METHOD OF TESTING THE SAME |
摘要 |
An integrated circuit has configurable logic blocks that are reconfigurable, hard-wired logic blocks that carry out fixed operations, and a memory. The memory stores configuration data for configuring the configurable logic blocks, block-connection data for determining connections between the configurable and hard-wired logic blocks, and partial-circuit-connection data for determining connections between partial circuits each of which consists of logic blocks selected among the configurable and hard-wired logic blocks. These pieces of data are shared by the logic blocks to reduce the number of memories in the integrated circuit and improve the packaging density of the integrated circuit.
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申请公布号 |
US2002010885(A1) |
申请公布日期 |
2002.01.24 |
申请号 |
US19980154027 |
申请日期 |
1998.09.16 |
申请人 |
OHUCHI KAZUNORI;YOSHIDA MASAKO;OOWAKI YUKIHITO;FUJII HIROSHIGE;SEKINE MASATOSHI |
发明人 |
OHUCHI KAZUNORI;YOSHIDA MASAKO;OOWAKI YUKIHITO;FUJII HIROSHIGE;SEKINE MASATOSHI |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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地址 |
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