发明名称 |
Stage apparatus which supports interferometer, stage position measurement method, projection exposure apparatus, projection exposure apparatus maintenance method, semiconductor device manufacturing method, and semiconductor manufacturing factory |
摘要 |
A stage apparatus on which a laser interferometer is mounted includes a reticle stage (1) movable in three, X-, Y-, and theta-axes, laser heads (8a-8d) each for generating a laser beam, interferometers (9a-9d) each of which is mounted on the stage (1) and splits the laser beam into reference and measurement beams, bar mirrors (11a-11c) each of which is arranged outside the stage (1) and reflects the measurement beam, and detectors (10a-10c) each for detecting the interference beam of the reference and measurement beams.
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申请公布号 |
US2002008877(A1) |
申请公布日期 |
2002.01.24 |
申请号 |
US20010866600 |
申请日期 |
2001.05.30 |
申请人 |
IWAMOTO KAZUNORI;ASANO TOSHIYA |
发明人 |
IWAMOTO KAZUNORI;ASANO TOSHIYA |
分类号 |
G01B11/00;G03F7/20;H01L21/027;(IPC1-7):G01P3/36;G01N21/00;G01J3/45;G01B9/02;G01B11/02;H01L21/66;G01R31/26 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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