发明名称 Optical arrangement and projection exposure system for microlithography with passive thermal compensation
摘要 An optical arrangement with a light source includes an optical element that is fastened in a mount. The light source emits radiation and the optical element is acted on thereby such that the heat that results lacks symmetry corresponding to the shape of the optical element. A connecting structure is provided between the optical element and the mount and has a symmetry that does not correspond to the shape of the optical element and effects an at least partial homogenization of the temperature distribution in the optical element.
申请公布号 US2002008858(A1) 申请公布日期 2002.01.24
申请号 US20010934817 申请日期 2001.08.21
申请人 发明人 WAGNER CHRISTIAN;TRUNZ MICHAEL;HILGERS RALF
分类号 G02B7/02;G03F7/20;(IPC1-7):G03B27/52 主分类号 G02B7/02
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