| 摘要 |
<p>PROBLEM TO BE SOLVED: To perform accurate qualitative analysis by accurately performing the comparison of the measured data of the intensity of diffracted X-rays and standard data even in such a case that a measuring condition of the measured data and the standard data is different, especially, a diffusion slit is different in the X-ray diffraction device. SOLUTION: In the X-ray diffraction device for measuring the intensity of diffracted X-rays obtained by irradiating a sample with X-rays through ther diffusion slit to perform qualitative analysis, a data correction means 5 for converting the intensity of diffracted X-rays of at least one of the measured data and standard data of X-ray diffraction to correct an intensity ratio of the intensity of diffracted X-rays due to the width of the diffusion slit is provided and the measuring conditions of the measured data and the standard data are made same by correcting the measured data and/or the standard data to accurately compare the measured intensity data and the standard intensity data to perform accurate qualitative analysis.</p> |
